Investigation Electric Properties of Dielectrics by C-V Characterization

Author: Zurab Kushitashvili
Keywords: Nanosize, dielectric, oxide
Annotation:

A CV measurement system has many important qualities that makes it a valuable support and a necessary tool in many activ- ities related to the IC industry and nowadays increasingly also in the photovoltaic (PV) eld. This type of electrical measure- ment is an eective way to gather informations about materials and devices. Furthermore, they are easy and fast to perfom and are exible enough to be used for dierent kinds of investiga- tion. As an additional advantage, a CV measurement system is considerably cheap compared to other material characterization equipment.